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Phys. Rev. Lett. 100, 135502 (2008) [5 pages]

X-Ray Diffuse Scattering Measurements of Nucleation Dynamics at Femtosecond Resolution

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A. M. Lindenberg et al.
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Received 29 November 2007; published 31 March 2008

Femtosecond time-resolved small and wide angle x-ray diffuse scattering techniques are applied to investigate the ultrafast nucleation processes that occur during the ablation process in semiconducting materials. Following intense optical excitation, a transient liquid state of high compressibility characterized by large-amplitude density fluctuations is observed and the buildup of these fluctuations is measured in real time. Small-angle scattering measurements reveal snapshots of the spontaneous nucleation of nanoscale voids within a metastable liquid and support theoretical predictions of the ablation process.

© 2008 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.100.135502
DOI:
10.1103/PhysRevLett.100.135502
PACS:
79.20.Ds, 61.05.cp, 61.20.Lc, 64.60.−i