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Phys. Rev. Lett. 100, 256403 (2008) [4 pages]

Anisotropy Contrast in Phonon-Enhanced Apertureless Near-Field Microscopy Using a Free-Electron Laser

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S. C. Kehr, M. Cebula, O. Mieth, T. Härtling, J. Seidel*, S. Grafström, and L. M. Eng
Institute of Applied Photophysics, Technische Universität Dresden, D-01062 Dresden, Germany

S. Winnerl, D. Stehr, and M. Helm
Institute of Ion Beam Physics and Materials Research, Forschungszentrum Dresden-Rossendorf, D-01314 Dresden, Germany

Received 20 December 2007; revised 14 May 2008; published 24 June 2008

We demonstrate the imaging of ferroelectric domains in BaTiO3, using an infrared-emitting free-electron laser as a tunable optical source for scattering scanning near-field optical microscopy and spectroscopy. When the laser is tuned into the spectral vicinity of a phonon resonance, ferroelectric domains can be resolved due to the anisotropy of the dielectric properties of the material. Slight detuning of the wavelength gives rise to a contrast reversal clearly evidencing the resonant character of the excitation. The near-field domain contrast shows that the orientation of the dielectric tensor with respect to the sample surface has a clear influence on the near-field signal.

© 2008 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.100.256403
DOI:
10.1103/PhysRevLett.100.256403
PACS:
71.36.+c, 68.37.Uv, 77.80.−e, 78.20.Fm

*Also at Department of Materials Science and Engineering, UC Berkeley, Berkeley, CA 94720, USA.

Corresponding author.

lukas.eng@iapp.de