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Phys. Rev. Lett. 101, 136103 (2008) [4 pages]

Colloidal Monolayer Trapped near a Charged Wall: A Synchrotron X-Ray Diffraction Study

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D. K. Satapathy1,*, O. Bunk1, K. Jefimovs1, K. Nygård1, H. Guo2, A. Diaz1, E. Perret1, F. Pfeiffer1,3, C. David1, G. H. Wegdam2, and J. F. van der Veen1,4
1Research Department of Synchrotron Radiation and Nanotechnology, Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
2Van der Waals-Zeeman Instituut, Universiteit van Amsterdam, 1018 XE Amsterdam, The Netherlands
3École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland
4ETH Zürich, 8093 Zürich, Switzerland

Received 26 June 2008; published 24 September 2008

See accompanying Physics Synopsis

Using x-ray diffraction from microfluidic channel arrays, we have determined concentration profiles of charge-stabilized silica colloids (radius 60±2  nm) confined between two like-charged dielectric walls at a few hundred nanometer distance. In solutions of very low ionic strength, strongly repulsive Coulomb interactions drive the colloids toward the central region between the walls. The addition of a small quantity of salt ions (0.2 mM) causes a dense colloidal monolayer to be trapped near the walls.

© 2008 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.101.136103
DOI:
10.1103/PhysRevLett.101.136103
PACS:
68.08.−p, 61.05.C−, 82.70.Dd, 87.19.rh

*dillip.satapathy@psi.ch

 
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