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Phys. Rev. Lett. 101, 076101 (2008) [4 pages]

Nanoscale Imaging with Resonant Coherent X Rays: Extension of Multiple-Wavelength Anomalous Diffraction to Nonperiodic Structures

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A. Scherz1,*, D. Zhu1,2, R. Rick1,2, W. F. Schlotter3, S. Roy1,†, J. Lüning4, and J. Stöhr1
1SSRL, Stanford Synchrotron Radiation Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025, USA
2Department of Applied Physics, 316 Via Pueblo Mall, Stanford University, Stanford, California 94035-4090, USA
3Institut für Experimentalphysik, Universität Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany
4Laboratoire de Chimie Physique, Université Pierre et Marie Curie, UMR du CNRS (7614), 11 Rue Pierre et Marie Curie, 75005 Paris, France, and Synchrotron SOLEIL, BP 48 91192, Gif-sur-Yvette, France

Received 13 April 2008; published 13 August 2008

The methodology of multiple-wavelength anomalous diffraction, widely used for macromolecular structure determination, is extended to the imaging of nonperiodic nanostructures. We demonstrate the solution of the phase problem by a combination of two resonantly recorded coherent scattering patterns at the carbon K edge (285 eV). Our approach merges iterative phase retrieval and x-ray holography approaches, yielding unique and rapid reconstructions. The element, chemical, and magnetic state specificity of our method further renders it widely applicable to a broad range of nanostructures, providing a spatial resolution that is limited, in principle, by wavelength only.

© 2008 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.101.076101
DOI:
10.1103/PhysRevLett.101.076101
PACS:
68.37.Yz, 42.40.Kw, 61.05.cp

*Corresponding author.

scherz@slac.stanford.edu

†Present address: Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

 
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