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Phys. Rev. Lett. 101, 090801 (2008) [4 pages]

Coherent X-Ray Diffraction Imaging with Nanofocused Illumination

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C. G. Schroer1, P. Boye1, J. M. Feldkamp1, J. Patommel1, A. Schropp1,3, A. Schwab1, S. Stephan1, M. Burghammer2, S. Schöder2, and C. Riekel2
1Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden, Germany
2ESRF, B. P. 220, F-38043 Grenoble, France
3HASYLAB at DESY, Notkestr. 85, D-22607 Hamburg, Germany

Received 26 April 2008; published 29 August 2008

Coherent x-ray diffraction imaging is an x-ray microscopy technique with the potential of reaching spatial resolutions well beyond the diffraction limits of x-ray microscopes based on optics. However, the available coherent dose at modern x-ray sources is limited, setting practical bounds on the spatial resolution of the technique. By focusing the available coherent flux onto the sample, the spatial resolution can be improved for radiation-hard specimens. A small gold particle (size <100  nm) was illuminated with a hard x-ray nanobeam (E=15.25  keV, beam dimensions ≈100×100  nm2) and is reconstructed from its coherent diffraction pattern. A resolution of about 5 nm is achieved in 600 s exposure time.

© 2008 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.101.090801
DOI:
10.1103/PhysRevLett.101.090801
PACS:
07.85.Tt, 42.30.Rx, 78.70.Ck