Phys. Rev. Lett. 102, 153002 (2009) [4 pages]High-Fidelity Transport of Trapped-Ion Qubits through an X-Junction Trap ArrayReceived 8 February 2009; published 16 April 2009 We report reliable transport of 9Be+ ions through an “X junction” in a 2D trap array that includes a separate loading and reservoir zone. During transport the ion’s kinetic energy in its local well increases by only a few motional quanta and internal-state coherences are preserved. We also examine two sources of energy gain during transport: a particular radio-frequency noise heating mechanism and digital sampling noise. Such studies are important to achieve scaling in a trapped-ion quantum information processor. © 2009 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.102.153002
DOI:
10.1103/PhysRevLett.102.153002
PACS:
37.10.Ty, 03.67.Lx, 37.10.Rs
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