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Phys. Rev. Lett. 102, 166104 (2009) [4 pages]

Two-Step Mechanism for Low-Temperature Oxidation of Vacancies in Graphene

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Johan M. Carlsson1,*, Felix Hanke1, Suljo Linic1,2, and Matthias Scheffler1
1Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, D-14195 Berlin, Germany
2Department of Chemical Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136, USA

Received 25 July 2008; revised 22 February 2009; published 23 April 2009

We study the oxidation of vacancies in graphene by ab initio atomistic thermodynamics to identify the dominant reaction mechanisms. Our calculations show that the low-temperature oxidation occurs via a two-step process: Vacancies are initially saturated by stable O groups, such as ether (C-O-C) and carbonyl (C​​=​​O). The etching is activated by a second step of additional O2 adsorption at the ether groups, forming larger O groups, such as lactone (C-O-C​​=​​O) and anhydride (O​​=​​C-O-C​​=​​O), that may desorb as CO2 just above room temperature. Our studies show that the partial pressure of oxygen is an important external parameter that affects the mechanisms of oxidation and that allows us to control the extent of etching.

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© 2009 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.102.166104
DOI:
10.1103/PhysRevLett.102.166104
PACS:
81.65.Mq, 61.72.jd, 81.05.Uw

*johanc@fhi-berlin.mpg.de