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Phys. Rev. Lett. 102, 073006 (2009) [4 pages]

Physical Mechanisms and Scaling Laws of K-Shell Double Photoionization

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J. Hoszowska1, A. K. Kheifets2, J.-Cl. Dousse1, M. Berset1, I. Bray3, W. Cao1, K. Fennane1, Y. Kayser1, M. Kavčič4, J. Szlachetko1,*, and M. Szlachetko1
1Department of Physics, University of Fribourg, CH-1700 Fribourg, Switzerland
2Research School of Physical Sciences, Australian National University, ACT 0200 Canberra, Australia
3ARC Centre for Matter-Antimatter Studies, Curtin University, WA 6845 Perth, Australia
4J. Stefan Institute, SI-1001, Ljubljana, Slovenia

Received 16 September 2008; published 20 February 2009

We report on the photon energy dependence of the K-shell double photoionization (DPI) of Mg, Al, and Si. The DPI cross sections were derived from high-resolution measurements of x-ray spectra following the radiative decay of the K-shell double vacancy states. Our data evince the relative importance of the final-state electron-electron interaction to the DPI. By comparing the double-to-single K-shell photoionization cross-section ratios for neutral atoms with convergent close-coupling calculations for He-like ions, the effect of outer shell electrons on the K-shell DPI process is assessed. Universal scaling of the DPI cross sections with the effective nuclear charge for neutral atoms is revealed.

© 2009 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.102.073006
DOI:
10.1103/PhysRevLett.102.073006
PACS:
32.80.Fb, 31.15.ve, 32.30.Rj, 32.70.−n

*Present address: ESRF, F-38043 Grenoble, France; on leave from Institute of Physics, Jan Kochanowski University, 25-406 Kielce, Poland.