Wavelength and Intensity Dependence of Short Pulse Laser Xenon Double Ionization between 500 and 2300 nm

The wavelength and intensity dependence of xenon ionization with 50 fs laser pulses has been studied using time-of-flight mass spectrometry. We compare the ion yield distribution of singly and doubly charged xenon with the Perelomov-Popov-Terent’ev (PPT) theory, Perelomov, Popov and Terent’ev Zh. Eksp. Teor. Fiz. 50 1393 (1966) Perelomov, Popov and Terent’ev Sov. Phys. JETP 23 924 (1966), in the regime between 500 and 2300 nm. The intensity dependence for each wavelength is measured in a range between 1×10¹³ and 1×10¹⁵  W/cm². The Xe⁺-ion signal is in good agreement with the PPT theory at all used wavelengths. In addition we demonstrate that ionic 5s5p^{6 2}S state is excited by an electron impact excitation process and contributes to the nonsequential double ionization process.