Phys. Rev. Lett. 103, 220801 (2009) [4 pages]Systematic Achievement of Improved Atomic-Scale Contrast via Bimodal Dynamic Force MicroscopyReceived 10 December 2008; published 23 November 2009 Judiciously matched experiments, calculations, and theory demonstrate that a higher sensitivity to short-range interactions and, consequently, improved resolution on the atomic scale can be achieved by bimodal noncontact dynamic force microscopy. The combination of sub-Ångström tip oscillation at the second flexural resonance of a commercially available silicon cantilever with the commonly used large amplitude oscillation at the fundamental resonance frequency enables this performance improvement while avoiding potentially damaging jump-to-contact instabilities. © 2009 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.103.220801
DOI:
10.1103/PhysRevLett.103.220801
PACS:
07.79.Lh, 34.20.Cf, 78.20.Bh
|
|
About | Terms and Conditions | Subscriptions | Search | Help
Use of the American Physical Society websites and journals implies that the user has read and agrees to our Terms and Conditions and any applicable Subscription Agreement. Physical Review®, Physical Review Letters®, Reviews of Modern Physics®, and Physical Review Special Topics® are trademarks of the American Physical Society.