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Phys. Rev. Lett. 36, 1332–1335 (1976)

Diffuse-Neutron-Scattering Measurements of the Fractional Occupancy of the Localized 4f1 Configuration in Ce-Th and CeAl3

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A. S. Edelstein
University of Illinois, Chicago, Illinois 60680, and Argonne National Laboratory, Argonne, Illinois 60439

H. R. Child
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830

C. Tranchita
University of Illinois, Chicago, Illinois 60680

Received 19 January 1976; published in the issue dated 31 May 1976

Diffuse-neutron-scattering measurements at 2<T<300 K have been employed to determine the fractional occupancy η of the localized 4f1 configuration. For CeAl3, η=0.9-1.0 at 11 K. For Ce0.8 Th0.2, η=0.4±0.1 at 11 K. No evidence of a compensating conduction-electron polatization was observed.

© 1976 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.36.1332
DOI:
10.1103/PhysRevLett.36.1332
PACS: