Phys. Rev. Lett. 38, 796–799 (1977)Critical Behavior of Random Resistor NetworksReceived 31 January 1977; published in the issue dated 11 April 1977 We present numerical data and scaling theories for the critical behavior of random resistor networks near the percolation threshold. We determine the critical exponents of a suitably defined resistance correlation function by a Padé analysis of low-concentration expansions as a function of dimensionality. We verify that d=6 is the critical dimensionality for the onset of mean-field behavior. We use the coherent-potential approximation to construct a mean-field scaling function for the critical region. © 1977 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.38.796
DOI:
10.1103/PhysRevLett.38.796
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