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Phys. Rev. Lett. 42, 1625–1628 (1979)

Comparative Reflectance Measurements on Laser-Produced Plasmas at 1.06 and 0.53 μm

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A. G. M. Maaswinkel, K. Eidmann, and R. Sigel
Projektgruppe für Laserforschung der Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V., D-8046 Garching bei München, Germany

Received 28 March 1979; published in the issue dated 11 June 1979

The total and specular reflectances of 1.06- and 0.53-μm laser pulses were measured on planar copper targets. The measurements were made with 30-ps pulses and an intensity on target of 1014 W/cm2. The direction of polarization and angle of incidence (0°-70°) were varied. Only a weak dependence of reflectance on wavelength is found; at both wavelengths reflectance is governed by the characteristic angle and polarization dependence of resonance absorption.

© 1979 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.42.1625
DOI:
10.1103/PhysRevLett.42.1625
PACS: