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Phys. Rev. Lett. 44, 496–500 (1980)

Extended Appearance-Potential Fine-Structure Analysis: Oxygen on Al(100)

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M. L. den Boer*, T. L. Einstein†, W. T. Elam‡, Robert L. Park, and L. D. Roelofs
Department of Physics and Astronomy, University of Maryland, College Park, Maryland 20742

G. E. Laramore
Department of Radiation Oncology, University of Washington, Seattle, Washington 98195

Received 18 July 1979; published in the issue dated 18 February 1980

To measure O-Al separation at Al(100) surfaces disordered (low-energy electron-diffraction beams extinguished) by reaction with oxygen, the extended appearance-potential fine structure was analyzed above the threshold for electron-bombardment excitation of the O 1s core. Calculation shows that the outgoing electron has angular momentum l=0, allowing simple Fourier inversion of the fine structure. The separation, 1.98±0.05 Å, suggests that oxygen lies under the top layer, a result undetectable in extended-x-ray-absorption fine-structure measurements on thicker films.

© 1980 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.44.496
DOI:
10.1103/PhysRevLett.44.496
PACS:

*Present address: Division of Physics, National Research Council, Ottawa, Ontario K1A 0R6, Canada.

†To whom correspondence should be addressed.

‡Present address: Department of Physics, FM15, University of Washington, Seattle, Washington 98195.

 
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