Phys. Rev. Lett. 58, 1240–1243 (1987)Resistance fluctuations in thin Bi wires and filmsSee Also: Erratum Received 7 July 1986; published in the issue dated 23 March 1987 We have observed fluctuations in the low-temperature resistance of small-diameter Bi wires, and Bi films. These fluctuations appear most clearly as a function of time. They become larger as the sample is made shorter, and as the temperature is reduced. Their magnitude and temperature dependence are in reasonable agreement with the recently developed theory of ‘‘universal’’ resistance fluctuations in one- and two-dimensional conductors. According to the theory, the fluctuations we have observed are due to the motion of single (or a small number of) scattering centers. © 1987 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.58.1240
DOI:
10.1103/PhysRevLett.58.1240
PACS:
71.55.Jv, 72.15.Lh, 73.60.Aq
See AlsoErratum: D. E. Beutler, T. L. Meisenheimer, and N. Giordano, Resistance Fluctuations in Thin Bi Wires and Films, Phys. Rev. Lett. 58, 2608 (1987). |
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