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Phys. Rev. Lett. 61, 428–431 (1988)

Scaling of the Droplet-Size Distribution in Vapor-Deposited Thin Films

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Fereydoon Family1 and Paul Meakin2
1Department of Physics, Emory University, Atlanta, Georgia 30322
2Central Research and Development Department, E. I. DuPont de Nemours and Company, Wilmington, Delaware 91881

Received 26 April 1988; published in the issue dated 25 July 1988

A dynamic-scaling approach is developed for the description of the droplet-size distribution in vapor-deposited thin films and processes where droplets are formed by nucleation, growth, and coalescence of the droplets. The exponent describing the scaling of the droplet-size distribution and the growth law for the mean droplet size are calculated exactly. A realistic, yet simple, droplet-growth model is developed. The simulation data are found to be consistent with the experiments on vapor-deposited tin and with the theoretical predictions in d=1, 2, and 3.

© 1988 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.61.428
DOI:
10.1103/PhysRevLett.61.428
PACS:
64.60.Ak, 64.60.Qb, 68.45.Da, 82.60.Nh

See Also

Comment: M. Kolb, Comment on ‘‘Scaling of the droplet-size distribution in vapor-deposited thin films’’, Phys. Rev. Lett. 62, 1699 (1989).