Phys. Rev. Lett. 62, 2317–2320 (1989)Universal Correlations between Tc and ns/m* (Carrier Density over Effective Mass) in High-Tc Cuprate SuperconductorsReceived 30 January 1989; published in the issue dated 8 May 1989 The muon-spin-relaxation rate σ has been measured in sixteen specimens of high-Tc cuprate superconductors (the 2:1:4, 1:2:3, 2:2:1:2, and 2:2:2:3 series). This has allowed us to study the magnetic field penetration depth λ and thus the superconducting carrier density ns divided by the effective mass m*(σ∝1/λ2∝ns/m*). A universal linear relation between Tc and σ(T→0)∝ns/m* has been found with increasing carrier doping. In heavily doped samples, however, Tc shows saturation and suppression with increasing ns/m*. This saturation starts at different values of ns/m* for materials with different multiplicities of CuO planes. © 1989 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.62.2317
DOI:
10.1103/PhysRevLett.62.2317
PACS:
74.70.Vy, 74.60.Mj, 74.65.+n, 76.75.+i
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