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APS » Journals » Phys. Rev. Lett. » Volume 65 » Issue 25
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Phys. Rev. Lett. 65, 3185–3188 (1990)

X-ray magnetic scattering in antiferromagnetic URu2Si2

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E. D. Isaacs, D. B. McWhan, R. N. Kleiman, and D. J. Bishop
AT&T Bell Laboratories, Murray Hill, New Jersey 07974

G. E. Ice and P. Zschack
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831

B. D. Gaulin, T. E. Mason, and J. D. Garrett
Department of Physics, McMaster University, Hamilton, Ontario, Canada L8S 4M1

W. J. L. Buyers
Atomic Energy of Canada Limited Research, Chalk River, Ontario, Canada K0J 1J0

Received 16 August 1990; published in the issue dated 17 December 1990

X-ray-resonance magnetic scattering has been used to study antiferromagnetic ordering in the small-moment (μ¯≃0.02μB) heavy-fermion superconductor URu2Si2. The intensity of the magnetic (003) reflection develops abruptly at TN≃17 K and grows linearly to T=3 K, where it saturates. Long-range antiferromagnetic order (ζ003c≃450 Å) persists into the superconducting state at Tc=1.3 K demonstrating the microscopic coexistence of these two ground states. At saturation, a remarkable peak intensity of 8 counts/sec was measured.

© 1990 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.65.3185
DOI:
10.1103/PhysRevLett.65.3185
PACS:
74.70.Tx, 75.25.+z, 75.30.Mb, 78.70.Ck
 
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