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Phys. Rev. Lett. 68, 3920–3923 (1992)

Picosecond capture of photoexcited holes by shallow acceptors in p-type GaAs

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A. Lohner, M. Woerner, T. Elsaesser, and W. Kaiser
Physik Department E 11, Technische Universität München, D-8046 Garching, Federal Republic of Germany

Received 14 February 1992; published in the issue dated 29 June 1992

Ultrafast recombination of holes with shallow acceptors in a III-V semiconductor is directly observed for the first time, by means of picosecond infrared spectroscopy. Neutral impurities in p-doped GaAs at low temperature are photoionized by picosecond infrared excitation. The recombination of free holes with negatively charged acceptors—monitored via absorption changes below the band edge—occurs on a time scale of several tens of picoseconds, following a nonexponential kinetics. Emission of longitudinal-optical phonons by the free holes is found to be the dominant mechanism of recombination.

© 1992 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.68.3920
DOI:
10.1103/PhysRevLett.68.3920
PACS:
78.47.+p, 71.55.Eq, 78.30.Fs