Phys. Rev. Lett. 69, 3743–3746 (1992)Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopyReceived 30 July 1992; published in the issue dated 28 December 1992 The use of a coherent field-emission electron source in transmission electron microscopy is combined with phase retrieval by digital processing of a focal image series. For the first time, a dramatic improvement of the high-resolution performance of the electron microscope beyond the usual ‘‘point-to-point’’ resolution has been realized: Experiments on a 200-kV microscope with a point resolution of 0.24 nm reveal reconstructed information down to 0.14 nm. Examples are shown in the field of high-Tc superconductors and ferroelectric oxides. The oxygen sublattice in these structures is revealed. © 1992 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.69.3743
DOI:
10.1103/PhysRevLett.69.3743
PACS:
61.16.Di
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