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Phys. Rev. Lett. 72, 3762–3766 (1994)

Measurement of the branching fraction scrB(τ-h-π0ντ)

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M. Artuso et al.
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Received 1 April 1994; published in the issue dated 13 June 1994

Using data from the CLEO II detector at the Cornell Electron Storage Ring, we measure scrB(τ-h-π0ντ) where h- refers to either π- or K-. We use three different methods to measure this branching fraction. The combined result is scrB(τ-h-π0ντ)=0.2587±0.0012±0.0042, in good agreement with standard model predictions.

© 1994 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.72.3762
DOI:
10.1103/PhysRevLett.72.3762
PACS:
13.35.Dx