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APS » Journals » Phys. Rev. Lett. » Volume 73 » Issue 13
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Phys. Rev. Lett. 73, 1845–1848 (1994)

Penetration Depth Measurements of 3D XY Critical Behavior in YBa2Cu3O6.95 Crystals

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S. Kamal1, D. A. Bonn1, Nigel Goldenfeld2, P. J. Hirschfeld3, Ruixing Liang1, and W. N. Hardy1
1Department of Physics, University of British Columbia, Vancouver, British Columbia, Canada V6T 1Z1
2Department of Physics, University of Illinois at Urbana-Champaign, 1110 West Green Street, Urbana, Illinois 61801-3080
3Department of Physics, University of Florida, Gainesville, Florida 32611

Received 21 March 1994; published in the issue dated 26 September 1994

We report measurements of the electromagnetic penetration depth λ(T) in nominally pure crystals of YBa2Cu3O6,95, for temperatures close to the critical temperature Tc. Over the range 0.001<(Tc-T)/Tc<0.1, we find that λ(T)∝(1-T/Tc)-y with y≈0.33, consistent with the critical behavior of the three dimensional XY model. The measured critical behavior is not affected by the presence of small amounts of Zn impurities, in agreement with the Harris criterion.

© 1994 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.73.1845
DOI:
10.1103/PhysRevLett.73.1845
PACS:
74.40.+k, 05.70.Jk, 74.25.Nf
 
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