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Phys. Rev. Lett. 74, 4309–4312 (1995)

Nanoscale Visualization and Control of Ferroelectric Domains by Atomic Force Microscopy

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Oleg Kolosov, Alexei Gruverman, Jun Hatano, Koichiro Takahashi, and Hiroshi Tokumoto
Joint Research Center for Atom Technology, Angstrom Technology Partnership and National Institute for Advanced Interdisciplinary Research, 1-1-2, Higashi, Tsukuba, Ibaraki 305, Japan
Mechanical Engineering Laboratory, Namiki 1-2, Tsukuba, Ibaraki 305, Japan
National Institute for Research in Inorganic Materials, 1-1 Namiki, Tsukuba, Ibaraki 305, Japan
Department of Materials Science and Technology, Science University of Tokyo, Noda, Chiba 278, Japan

Received 17 March 1994; published in the issue dated 22 May 1995

The nanoscale visualization and control of domain structure with atomic force microscopy (AFM) in the ferroelectric crystal guanidinium aluminum sulfate hexahydrate is reported. The origin of the domain contrast in the topographic of AFM images is explained by the piezoelectric deformation of the crystal surface in the internal electric field. The domain structure was modified by applying a voltage to the conductive AFM tip. The dynamics of domain growth has been directly observed for the first time with a resolution of 10 nm.

© 1995 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.74.4309
DOI:
10.1103/PhysRevLett.74.4309
PACS:
77.80.Dj, 85.42.+m, 85.50.Ly

See Also

Comment: R. Lüthi and E. Meyer, Comment on “Nanoscale Visualization and Control of Ferroelectric Domains by Atomic Force Microscopy”, Phys. Rev. Lett. 76, 4291 (1996).

Reply: Oleg Kolosov, Kolosov Replies:, Phys. Rev. Lett. 76, 4292 (1996).