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Phys. Rev. Lett. 75, 3138–3141 (1995)

Dynamics and Morphology of Brittle Cracks: A Molecular-Dynamics Study of Silicon Nitride

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Aiichiro Nakano, Rajiv K. Kalia, and Priya Vashishta
Concurrent Computing Laboratory for Materials Simulations, Department of Computer Science, Department of Physics and Astronomy, Louisiana State University, Baton Rouge, Louisiana 70803

Received 5 May 1995; published in the issue dated 23 October 1995

Crack propagation in amorphous Si3N4 films is investigated with large-scale molecular-dynamics simulations on parallel machines. We observe a correlation between the speed of crack propagation and the morphology of fracture surfaces. Initially, as the crack propagates slowly, the roughness exponent for fracture surfaces is found to be 0.44. However, beyond a certain speed of crack propagation, the exponent crosses over to 0.8. This crossover behavior is similar to the recent experimental finding by Bouchaud and Navéos.

© 1995 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.75.3138
DOI:
10.1103/PhysRevLett.75.3138
PACS:
61.43.Bn, 61.20.Ja, 62.20.Mk