Phys. Rev. Lett. 75, 4516–4519 (1995)In-Plane and ĉ-Axis Microwave Penetration Depth of Bi2Sr2Ca1Cu2O8+δ CrystalsReceived 3 August 1995; published in the issue dated 11 December 1995 The complete temperature dependences of the in-plane and ĉ-axis microwave (10 GHz) penetration depth λ(T) and the surface resistance Rs(T) of high quality Bi2Sr2Ca1Cu2O8+δ crystals are reported. In contrast to earlier measurements, a leading λab∝T dependence is observed at low temperatures, consistent with nodes in the in-plane gap. The overall behavior of λab(T) and Rsab(T) is similar to that of YBa2Cu3Oy at low T, but differs at temperatures near Tc. The ĉ-axis penetration depth λc(T) is shown to best agree with a model of weakly coupled superconducting layers with nodes in the gap. © 1995 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.75.4516
DOI:
10.1103/PhysRevLett.75.4516
PACS:
74.25.Nf, 74.72.Bk, 74.50.+r
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