Phys. Rev. Lett. 76, 3979–3982 (1996)Low Energy Off-Axis Holography in Electron MicroscopyReceived 19 January 1996; published in the issue dated 20 May 1996 A new technique of microscopic investigation is proposed by combining projection electron microscopy and off-axis holography. On the basis of the strong scattering of low energy electrons by light elements, this technique would be suitable for the observation of organic materials with a resolution better than 1 nm. A model has been developed to reconstruct the observed object from the holograms. Preliminary experimental results are obtained at medium resolution: 7 nm on networks of carbon fibers. © 1996 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.76.3979
DOI:
10.1103/PhysRevLett.76.3979
PACS:
61.14.Nm
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