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Phys. Rev. Lett. 77, 3407–3410 (1996)

Identification of the Native Vacancy Defects in Both Sublattices of ZnSxSe1-x by Positron Annihilation

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K. Saarinen, T. Laine, K. Skog, J. Mäkinen, and P. Hautojärvi
Laboratory of Physics, Helsinki University of Technology, 02150 Espoo, Finland

K. Rakennus, P. Uusimaa, A. Salokatve, and M. Pessa
Department of Physics, Tampere University of Technology, P.O. Box 692, 33101 Tampere, Finland

Received 15 February 1996; published in the issue dated 14 October 1996

We show how positron annihilation can distinguish vacancies in the different sublattices of a binary compound by performing experiments in ZnSxSe1-x layers. We identify the Se vacancies (VSe) in N-doped and the Zn vacancies (VZn) in Cl-doped material by the shape of the core electron momentum distribution. The charge of the defect involving VSe is neutral or negative in p-type ZnSxSe1-x, suggesting that VSe is complexed with an acceptor. The concentration of the VSe complexes is high (≥1018cm-3), indicating that their role is important in the electrical compensation of p-type ZnSxSe1-x.

© 1996 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.77.3407
DOI:
10.1103/PhysRevLett.77.3407
PACS:
71.55.Gs, 73.61.Ga, 78.70.Bj