Phys. Rev. Lett. 77, 3557–3560 (1996)Charge-Exchange Atoms and Ion Source Divergence in a 20 TW Applied-B Ion DiodeReceived 29 April 1996; published in the issue dated 21 October 1996 Space- and time-resolved spectroscopy is used to measure properties of several-keV Li atoms in a 20 TW ion diode. These measurements out in the diode anode-cathode gap are used in a charge-exchange model for the Li atom production in order to obtain the Li+ beam angular divergence within 50 μm of the LiF-coated anode surface. This ion divergence near the surface is surprisingly large, and accounts for about half the typical 25 mrad final accelerated-beam divergence. The measurements provide constraints for models attempting to explain highly diverging ion emission from thin alkali-halide films in ∼10MV/cm applied fields. © 1996 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.77.3557
DOI:
10.1103/PhysRevLett.77.3557
PACS:
52.75.Pv, 41.75.Ak, 52.25.Ya
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