Phys. Rev. Lett. 77, 4182–4185 (1996)X-Ray Based Subpicosecond Electron Bunch Characterization Using 90° Thomson ScatteringReceived 17 June 1996; revised 23 September 1996; published in the issue dated 11 November 1996 X rays produced by 90° Thomson scattering of a femtosecond, near infrared, terawatt laser pulse of a 50 MeV electron beam are shown to be an effective diagnostic to measure transverse and longitudinal density distributions of an electron beam ( e beam) with subpicosecond time resolution. The laser beam was focused onto the e-beam waist, generating 30 keV x rays in the forward direction. The transverse and longitudinal e-beam structures have been obtained by measuring the intensity of the x-ray beam, while scanning the laser beam across the e beam in space and time. The e-beam divergence has been obtained through measurement of spatial and spectral characteristics of the scattered x-ray beam. © 1996 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.77.4182
DOI:
10.1103/PhysRevLett.77.4182
PACS:
29.27.Fh, 13.60.Fz, 42.62.Hk
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