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Phys. Rev. Lett. 77, 1508–1511 (1996)

Polarized X-ray Fluorescence as a Probe of Ground State Properties

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Michel van Veenendaal, J. B. Goedkoop, and B. T. Thole
European Synchrotron Radiation Facility, B.P. 220, F-38043 Grenoble Cédex, France

Received 29 April 1996; published in the issue dated 19 August 1996

Applicability of x-ray absorption sum rules to spectra detected with total fluorescence yield is studied by calculations in the ionic limit of the rare earth 3d→4f and transition metal 2p→3d spectra. We show that if no intermediate states with a high LS purity are reached, the dependence of the integrated intensity of fluorescence yield on the incoming polarization is mainly determined by the absorption step. Therefore, although in principle fluorescence yield is unequal to x-ray absorption, in the presence of a crystal field or of strong core-hole spin-orbit coupling fluorescence yield can be used to obtain ground state expectation values of Lz and Sz.

© 1996 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.77.1508
DOI:
10.1103/PhysRevLett.77.1508
PACS:
61.10.Dp, 78.70.Ck, 78.70.En