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Phys. Rev. Lett. 78, 760–763 (1997)

Rotation Sensing with an Atom Interferometer

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Alan Lenef, Troy D. Hammond, Edward T. Smith, Michael S. Chapman, Richard A. Rubenstein, and David E. Pritchard
Department of Physics and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

Received 12 August 1996; published in the issue dated 3 February 1997

We have measured the phase shift induced by rotation of an atom interferometer at rates of -2 to +2 earth rates and obtained 1% agreement with the predicted Sagnac phase shift for atomic matter waves. The rotational rms noise of our interferometer was 42 milliearth rates for 1 sec of integration time, within 9% of shot noise. The high sensitivity and agreement of predicted and measured behavior suggest useful future scientific applications of atom interferometers as inertial sensors.

© 1997 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.78.760
DOI:
10.1103/PhysRevLett.78.760
PACS:
03.75.Dg, 06.30.Gv