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Phys. Rev. Lett. 80, 3268–3271 (1998)

Solving the Phase Problem Using Reference-Beam X-Ray Diffraction

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Qun Shen
Cornell High Energy Synchrotron Source and Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853

Received 24 November 1997; published in the issue dated 13 April 1998

A new method of obtaining Bragg reflection phases in an x-ray diffraction experiment is presented. It combines the phase-sensitive principles of multiple-beam diffraction and x-ray standing waves, and allows direct phase measurements of many multiple reflections simultaneously using a Bragg-inclined oscillating-crystal geometry. A modified-two-beam intensity function is devised to extract the phase information in a way similar to the standing wave analyses.

© 1998 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.80.3268
DOI:
10.1103/PhysRevLett.80.3268
PACS:
61.10.-i, 42.25.Fx, 78.70.Ck