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Phys. Rev. Lett. 80, 4895–4898 (1998)

Imaging Buried Interfacial Lattices with Quantized Electrons

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I. B. Altfeder and D. M. Chen
The Rowland Institute for Science, Cambridge, Massachusetts 02142

K. A. Matveev
Department of Physics, Duke University, Durham, North Carolina 27708

Received 16 October 1997; published in the issue dated 1 June 1998

See accompanying Physics Focus

We demonstrate that the well-known Si(111)-(7×7) superlattice buried under as much as 100 Å of crystalline Pb can be directly imaged with a scanning tunneling microscope at 77 K. The unexpected transparency of the metal and the high lateral resolution are the result of a nondiffractive scattering of the electrons at the interface. We attribute this phenomenon to a large anisotropy of the effective masses associated with the free in-plane and the quantized transverse motion of the electrons.

© 1998 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.80.4895
DOI:
10.1103/PhysRevLett.80.4895
PACS:
61.16.Ch, 71.18.+y, 73.20.Dx, 79.60.Jv