Phys. Rev. Lett. 80, 5381–5384 (1998)“Electronic Growth” of Metallic Overlayers on Semiconductor SubstratesReceived 3 November 1997; published in the issue dated 15 June 1998 We present a novel “electronic growth” model for metallic thin films on semiconductor substrates. Depending on the competition between the effects of quantum confinement, charge spilling, and interface-induced Friedel oscillations, different types of film stability are defined, as characterized by the existence of critical/magic thicknesses for smooth growth. In particular, smooth growth can be achieved only above a few monolayers for noble metals, and only for the first layer for alkali metals. © 1998 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.80.5381
DOI:
10.1103/PhysRevLett.80.5381
PACS:
68.55.Jk, 68.35.Md, 68.35.Rh, 73.20.Dx
|
|
About | Terms and Conditions | Subscriptions | Search | Help
Use of the American Physical Society websites and journals implies that the user has read and agrees to our Terms and Conditions and any applicable Subscription Agreement. Physical Review®, Physical Review Letters®, Reviews of Modern Physics®, and Physical Review Special Topics® are trademarks of the American Physical Society.