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Phys. Rev. Lett. 81, 3936–3939 (1998)

Bad Metals Made with Good-Metal Components

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S. B. Arnason, S. P. Herschfield, and A. F. Hebard
Department of Physics, University of Florida, Gainesville, Florida 32611

Received 22 December 1997; revised 12 June 1998; published in the issue dated 2 November 1998

We have grown thin stable films of a good metal, Ag, that have characteristics of bad metals: high resistivity, strong temperature dependence of resistivity, and lack of resistive saturation. For films of different thickness, the temperature-dependent resistance and the Hall effect resistance provide evidence that the apparent bad metallicity is a consequence of the microstructure of the film rather than the result of new physics. This microstructure, which we characterize with scanning probe techniques, occurs on length scales comparable to the mean free path, thereby changing the sign of the classical magnetoresistance from positive to negative.

© 1998 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.81.3936
DOI:
10.1103/PhysRevLett.81.3936
PACS:
73.50.Jt