Phys. Rev. Lett. 81, 5832–5835 (1998)

Coherent X-Ray Study of Fluctuations during Domain Coarsening

Abstract

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A. Malik¹, A. R. Sandy², L. B. Lurio², G. B. Stephenson¹, S. G. J. Mochrie², I. McNulty³, and M. Sutton⁴
¹Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439
²Center for Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
³Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439
⁴Physics Department, McGill University, Montreal, Quebec H3A 2T8 Canada

Received 5 August 1998; published in the issue dated 28 December 1998

We report observations of the dynamics of the exact structure factor (speckle pattern) during phase separation in a sodium borosilicate glass, measured using intensity fluctuation spectroscopy with a coherent x-ray beam. Nonequilibrium fluctuations in the structure factor are analyzed using a two-time correlation function to extract the time-dependent and wave-number-dependent correlation time. The behavior of the correlation time is in agreement with a scaling law previously found in simulations.

URL:

http://link.aps.org/doi/10.1103/PhysRevLett.81.5832

DOI:

10.1103/PhysRevLett.81.5832

PACS:

61.10.Eq, 64.60.-i, 64.75.+g

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Phys. Rev. Lett. 81, 5832–5835 (1998)

Coherent X-Ray Study of Fluctuations during Domain Coarsening