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APS » Journals » Phys. Rev. Lett. » Volume 82 » Issue 10
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Phys. Rev. Lett. 82, 2068–2070 (1999)

4d Photoionization of Free Singly Charged Xenon Ions

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A. Gottwald, Ch. Gerth, and M. Richter*
Institut für Atomare und Analytische Physik, TU Berlin, Hardenbergstrasse 36, D-10623 Berlin, Germany

Received 15 June 1998; revised 23 October 1998; published in the issue dated 8 March 1999

Electron spectroscopy in direct 4d photoionization of free Xe+ ions has been realized for the first time, applying various timing and coincidence techniques to suppress and to monitor on line the strong fluctuating background. The ionization energies of 4d5/2 and 4d3/2 electrons of Xe+(5p52P3/2) and Xe+(5p52P1/2) were determined and compared to calculated RHF(CI) values and to corresponding results of neutral Xe(5p61S0) atoms to study the influence of the outer-shell electron occupation on the 4d-1 inner-shell process.

© 1999 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.82.2068
DOI:
10.1103/PhysRevLett.82.2068
PACS:
32.80.Hd, 32.80.Fb

*Permanent address: PTB/BESSY, Lentzeallee 100, D-14195 Berlin, Germany.

 
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