Phys. Rev. Lett. 82, 2326–2329 (1999)Observation of Molecular Layering in Thin Liquid Films Using X-Ray Reflectivity
See accompanying Physics Focus We report the direct observation of internal layering in thin ( ∼45–90Å) liquid films of nearly spherical, nonpolar molecules, tetrakis(2-ethylhexoxy)silane, using synchrotron x-ray reflectivity. The Patterson functions have secondary maxima indicating layer formation, and model-independent fitting to the reflectivity data shows that there are three electron density oscillations near the solid-liquid interface, with a period of ∼10Å (consistent with the molecular dimensions). The oscillation amplitude has a strong inverse dependence on the substrate surface roughness. © 1999 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.82.2326
DOI:
10.1103/PhysRevLett.82.2326
PACS:
68.15.+e, 61.20.-p, 68.45.-v
|
|
About | Terms and Conditions | Subscriptions | Search | Help
Use of the American Physical Society websites and journals implies that the user has read and agrees to our Terms and Conditions and any applicable Subscription Agreement. Physical Review®, Physical Review Letters®, Reviews of Modern Physics®, and Physical Review Special Topics® are trademarks of the American Physical Society.