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APS » Journals » Phys. Rev. Lett. » Volume 82 » Issue 26
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Phys. Rev. Lett. 82, 5261–5264 (1999)

Measurement of Electron-Beam Bunch Length and Emittance Using Shot-Noise-Driven Fluctuations in Incoherent Radiation

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P. Catravas, W. P. Leemans, J. S. Wurtele, and M. S. Zolotorev*
Center for Beam Physics, Lawrence Berkeley National Laboratory, Berkeley, California 94720

M. Babzien, I. Ben-Zvi, Z. Segalov, X.-J. Wang, and V. Yakimenko
Accelerator Test Facility, Brookhaven National Laboratory, Upton, New York 11973

Received 22 December 1998; published in the issue dated 28 June 1999

Longitudinal and transverse phase space information has been obtained from a statistical analysis of fluctuations in the radiation spectrum of an electron bunch. Uncorrelated shot noise fluctuations in longitudinal beam density result in incoherent radiation with a spectrum that consists of spikes, with width inversely proportional to the bunch length. Measurements were performed at λ = 620nm on a 1–5 ps long, 44 MeV bunch propagating through a wiggler. Bunch length and emittance obtained with this single shot technique agree with independent measurements.

© 1999 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.82.5261
DOI:
10.1103/PhysRevLett.82.5261
PACS:
41.75.Ht, 05.40.Ca

*Mailing address: Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., MS71-259, Berkeley, CA 94720.

 
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