Phys. Rev. Lett. 83, 3001–3004 (1999)Identifying Molecular Orientation of Individual C60 on a Si(111)-(7×7) SurfaceReceived 21 April 1999; published in the issue dated 11 October 1999 Low temperature scanning tunneling microscopy (STM) has been used to identify the molecular orientation of individual C60 on Si(111)-(7×7) surfaces. The STM images of individual C60 reveal clear and rich intramolecular features that are site and bias dependent. Theoretical simulations, using the local density approximation method with cluster models, uniquely reproduce the observed STM images and hence allow the unambiguous identification of the binding configurations of the adsorbed fullerenes with respect to the Si substrate. © 1999 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.83.3001
DOI:
10.1103/PhysRevLett.83.3001
PACS:
82.65.My, 61.16.Ch, 61.48.+c, 71.15.Mb
See AlsoComment: J. I. Pascual, J. Gómez-Herrero, A. M. Baró, Daniel Sánchez-Portal, Emilio Artacho, Pablo Ordejón, and José M. Soler, Comment on “Identifying Molecular Orientation of Individual C60 on a Si(111)-(7×7) Surface”, Phys. Rev. Lett. 85, 2653 (2000). Reply: J. G. Hou, Yang Jinlong, Wang Haiqian, Li Qunxiang, Zeng Changgan, Lin Hai, Bing Wang, D. M. Chen, and Zhu Qingshi, Hou et al. Reply:, Phys. Rev. Lett. 85, 2654 (2000). |
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