Phys. Rev. Lett. 83, 4073–4076 (1999)Optical Reflectivity and Ellipsometry Studies of the Sm-Cα* PhaseReceived 6 July 1999; published in the issue dated 15 November 1999 Both optical reflectivity and ellipsometry data obtained from freestanding films in the Sm-Cα* phase of one liquid-crystal compound display characteristic oscillations as a function of temperature. A model for the film consisting of surface anticlinic layers and an interior short-pitched azimuthal helix provides an excellent description of our data. Our results show a linear evolution with temperature of the relative interlayer azimuthal angle. The data enable us to place an upper bound on the degree of distortion in the short-pitched helix. © 1999 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.83.4073
DOI:
10.1103/PhysRevLett.83.4073
PACS:
61.30.Eb, 77.84.Nh, 83.70.Jr
|
|
About | Terms and Conditions | Subscriptions | Search | Help
Use of the American Physical Society websites and journals implies that the user has read and agrees to our Terms and Conditions and any applicable Subscription Agreement. Physical Review®, Physical Review Letters®, Reviews of Modern Physics®, and Physical Review Special Topics® are trademarks of the American Physical Society.