Phys. Rev. Lett. 83, 4089–4092 (1999)High Real-Space Resolution Measurement of the Local Structure of Ga1-xInxAs Using X-Ray DiffractionReceived 7 June 1999; published in the issue dated 15 November 1999 High real-space resolution atomic pair distribution functions PDFs from the alloy series Ga1-xlnxAs have been obtained using high-energy x-ray diffraction. The first peak in the PDF is resolved as a doublet due to the presence of two nearest neighbor bond lengths, Ga-As and In-As, as previously observed using x-ray absorption fine structure. The widths of nearest, and higher, neighbor PDF peaks are analyzed by separating the broadening due to static atom displacements from the thermal motion. The PDF peak width is 5 times larger for distant atomic neighbors than for nearest neighbors. The results are in agreement with model calculations. © 1999 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.83.4089
DOI:
10.1103/PhysRevLett.83.4089
PACS:
61.66.Dk, 61.43.Dq, 61.72.Dd
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