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Phys. Rev. Lett. 83, 4089–4092 (1999)

High Real-Space Resolution Measurement of the Local Structure of Ga1-xInxAs Using X-Ray Diffraction

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V. Petkov1, I-K. Jeong1, J. S. Chung1, M. F. Thorpe1, S. Kycia2, and S. J. L. Billinge1
1Department of Physics and Astronomy and Center for Fundamental Materials Research, Michigan State University, East Lansing, Michigan 48824-1116
2Cornell High Energy Synchrotron Source, Cornell University, Ithaca, New York 14853

Received 7 June 1999; published in the issue dated 15 November 1999

High real-space resolution atomic pair distribution functions PDFs from the alloy series Ga1-xlnxAs have been obtained using high-energy x-ray diffraction. The first peak in the PDF is resolved as a doublet due to the presence of two nearest neighbor bond lengths, Ga-As and In-As, as previously observed using x-ray absorption fine structure. The widths of nearest, and higher, neighbor PDF peaks are analyzed by separating the broadening due to static atom displacements from the thermal motion. The PDF peak width is 5 times larger for distant atomic neighbors than for nearest neighbors. The results are in agreement with model calculations.

© 1999 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.83.4089
DOI:
10.1103/PhysRevLett.83.4089
PACS:
61.66.Dk, 61.43.Dq, 61.72.Dd