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APS » Journals » Phys. Rev. Lett. » Volume 83 » Issue 21
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Phys. Rev. Lett. 83, 4229–4232 (1999)

Towards Realization of an Atomic de Broglie Microscope: Helium Atom Focusing Using Fresnel Zone Plates

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R. B. Doak1,2,4, R. E. Grisenti2, S. Rehbein3, G. Schmahl3, J. P. Toennies2, and Ch. Wöll4
1Department of Physics and Astronomy, Arizona State University, Tempe, Arizona 85287-1504
2Max-Planck-Institut für Strömungsforschung, Bunsenstraße 10, D-37073 Göttingen, Germany
3Institut für Röntgenphysik, Universität Göttingen, D-37073 Göttingen, Germany
4Physikalische Chemie I, Ruhr-Universität Bochum, D-44780 Bochum, Germany

Received 27 July 1999; published in the issue dated 22 November 1999

A neutral, ground-state, 4He atom beam has been focused using Fresnel zone plates. At only moderate demagnification (0.40×), a focused spot diameter of ≤2.0 μm is achieved at a signal intensity of 500 counts/s. This is an improvement over previous work by a factor of 10 in resolution, 103 in signal intensity, and 108 in focused beam density, and allows the full intrinsic intensity profile of a focused atomic Fresnel spot to be measured for the first time. Raster scans of 15 and 25 μm wide slits across the focused spot demonstrate transmission scanning helium de Broglie microscopy of micron resolution.

© 1999 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.83.4229
DOI:
10.1103/PhysRevLett.83.4229
PACS:
03.75.Be, 39.10.+j, 42.79.Ci, 85.40.Ux
 
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