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Phys. Rev. Lett. 83, 1755–1758 (1999)

Determination of Atom-Surface van der Waals Potentials from Transmission-Grating Diffraction Intensities

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R. E. Grisenti, W. Schöllkopf, and J. P. Toennies
Max-Planck-Institut für Strömungsforschung, Bunsenstraße 10, 37073 Göttingen, Germany

G. C. Hegerfeldt and T. Köhler
Institut für Theoretische Physik, Universität Göttingen, Bunsenstraße 9, 37073 Göttingen, Germany

Received 21 May 1999; published in the issue dated 30 August 1999

Molecular beams of rare gas atoms and D2 have been diffracted from 100-nm-period SiNx transmission gratings. The relative intensities of the diffraction peaks out to the eighth order depend on the diffracting particle and are interpreted in terms of effective slit widths. These differences have been analyzed by a new theory which accounts for the long-range van der Waals -C3/l3 interaction of the particles with the walls of the grating bars. The values of the C3 constant for two different gratings are in good agreement and the results exhibit the expected linear dependence on the dipole polarizability.

© 1999 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.83.1755
DOI:
10.1103/PhysRevLett.83.1755
PACS:
34.50.Dy, 03.75.Be