Phys. Rev. Lett. 84, 2642–2645 (2000)

Low Temperature Scanning Force Microscopy of the Si(111)-(7×7) Surface

Abstract

References

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M. A. Lantz¹, H. J. Hug¹, P. J. A. van Schendel¹, R. Hoffmann¹, S. Martin¹, A. Baratoff¹, A. Abdurixit¹, H.-J. Güntherodt¹, and Ch. Gerber²
¹Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland
²IBM Research Division, Zürich Research Laboratory, Säumerstrasse 4, CH-8803 Rüschlikon, Switzerland

Received 1 December 1999; published in the issue dated 20 March 2000

See accompanying Physics Focus

A low temperature scanning force microscope (SFM) operating in a dynamic mode in ultrahigh vacuum was used to study the Si(111)- (7×7) surface at 7.2 K. Not only the twelve adatoms but also the six rest atoms of the unit cell are clearly resolved for the first time with SFM. In addition, the first measurements of the short range chemical bonding forces above specific atomic sites are presented. The data are in good agreement with first principles computations and indicate that the nearest atoms in the tip and sample relax significantly when the tip is within a few Å of the surface.

URL:

http://link.aps.org/doi/10.1103/PhysRevLett.84.2642

DOI:

10.1103/PhysRevLett.84.2642

PACS:

61.16.Ch, 07.79.-v, 34.20.Cf

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Phys. Rev. Lett. 84, 2642–2645 (2000)

Low Temperature Scanning Force Microscopy of the Si(111)-(7×7) Surface