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APS » Journals » Phys. Rev. Lett. » Volume 84 » Issue 21
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Phys. Rev. Lett. 84, 4958–4961 (2000)

Depth-Resolved Profile of the Magnetic Field beneath the Surface of a Superconductor with a Few nm Resolution

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T. J. Jackson1, T. M. Riseman1, E. M. Forgan1, H. Glückler2, T. Prokscha2, E. Morenzoni2, M. Pleines2,3, Ch. Niedermayer3, G. Schatz3, H. Luetkens2,4, and J. Litterst4
1School of Physics and Astronomy, University of Birmingham, Birmingham B15 2TT, United Kingdom
2Labor für Myonspinspektroskopie, Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland
3Universität Konstanz, Fakultät für Physik, D-78434 Konstanz, Germany
4Technische Universität Braunschweig, D-38106 Braunschweig, Germany

Received 7 February 2000; published in the issue dated 22 May 2000

See accompanying Physics Focus

The variation of a magnetic field as a function of depth beneath the surface of an YBa2Cu3O7-δ thin film in the Meissner state has been measured using low energy muons. The depth of implantation was varied from 20–150 nm by tuning the energy of the implanted muons from 3–30 keV. These are direct measurements of the penetration of a magnetic field beneath a superconducting surface which illustrate the power of low energy muons for near surface studies in superconductivity and magnetism.

© 2000 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.84.4958
DOI:
10.1103/PhysRevLett.84.4958
PACS:
74.25.Ha, 74.76.Bz, 76.75.+i
 
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