Phys. Rev. Lett. 85, 3229–3232 (2000)Kinetic Roughening in Polymer Film Growth by Vapor DepositionReceived 24 April 2000; published in the issue dated 9 October 2000 The growth front roughness of linear poly( p-xylylene) films grown by vapor deposition polymerization has been investigated using atomic force microscopy. The interface width w increases as a power law of film thickness d, w∼dβ, with β = 0.25±0.03, and the lateral correlation length ξ grows as ξ∼d1/z, with 1/z = 0.31±0.02. This novel scaling behavior is interpreted as the result of monomer bulk diffusion, and belongs to a new universality class that has not been discussed previously. © 2000 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevLett.85.3229
DOI:
10.1103/PhysRevLett.85.3229
PACS:
68.55.Jk, 81.10.Bk, 81.15.-z
See AlsoComment: P. Punyindu and S. Das Sarma, Comment on “Kinetic Roughening in Polymer Film Growth by Vapor Deposition”, Phys. Rev. Lett. 86, 2696 (2001). Reply: Y.-P. Zhao, T.-M. Lu, and G.-C. Wang, Zhao, Lu, and Wang Reply:, Phys. Rev. Lett. 86, 2697 (2001). |
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