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Phys. Rev. Lett. 85, 3476–3479 (2000)

Electronic Transport in Y-Junction Carbon Nanotubes

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C. Papadopoulos1, A. Rakitin1, J. Li1, A. S. Vedeneev1,2, and J. M. Xu1,3
1Department of Electrical & Computer Engineering, University of Toronto, 10 King's College Road, Toronto, Ontario, Canada M5S 3G4
2Russian Academy of Sciences, Institute of Radioengineering and Electronics, Fryazino, Moscow district 141120, Russia
3Division of Engineering, Brown University, Providence, Rhode Island 02912

Received 22 February 2000; published in the issue dated 16 October 2000

Electronic transport measurements were performed on Y-junction carbon nanotubes. These novel junctions contain a large diameter tube branched into smaller ones. Independent measurements using good quality contacts on both individual Y junctions and many in parallel show intrinsic nonlinear transport and reproducible rectifying behavior at room temperature. The results were modeled using classic interface physics for a junction with an abrupt change in band gap due to the change in tube diameter. These Y-junction tubes represent new heterojunctions for nanoelectronics.

© 2000 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.85.3476
DOI:
10.1103/PhysRevLett.85.3476
PACS:
73.61.Tm, 61.46.+w, 73.40.Ei, 85.30.Kk