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APS » Journals » Phys. Rev. Lett. » Volume 85 » Issue 19
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Phys. Rev. Lett. 85, 4024–4027 (2000)

Slow Photoelectron Imaging

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Céline Nicole, Ingrid Sluimer, Florentina Rosca-Pruna, Marcel Warntjes, and Marc Vrakking*
FOM Institute for Atomic and Molecular Physics (AMOLF), Kruislaan 407, 1098 SJ Amsterdam, The Netherlands

Christian Bordas
Laboratoire de Spectrométrie Ionique et Moléculaire, UMR CNRS 5579, Université Claude Bernard, Lyon 1, Villeurbanne Cedex, France

Frederic Texier and Francis Robicheaux
Department of Physics, Auburn University, Auburn, Alabama 36849

Received 24 May 2000; published in the issue dated 6 November 2000

Experiments are reported on the detection of slow photoelectrons resulting from the photoionization of Xe atoms in a dc electric field by electron imaging. In the far-field photoelectron velocity distributions we can distinguish between direct and indirect ionization processes (involving long range Coulomb interactions with the Xe+ ion). Also, a new modulation of the velocity distribution is observed which cannot be explained by previously discussed mechanisms. Classical and quantum mechanical calculations are presented to support the interpretations.

© 2000 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.85.4024
DOI:
10.1103/PhysRevLett.85.4024
PACS:
32.80.Fb, 07.81.+a, 32.60.+i, 32.80.Rm

*Corresponding author.

 
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