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APS » Journals » Phys. Rev. Lett. » Volume 85 » Issue 24
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Phys. Rev. Lett. 85, 5126–5129 (2000)

Picometer Accuracy in Measuring Lattice Displacements Across Planar Faults by Interferometry in Coherent Electron Diffraction

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Lijun Wu, Yimei Zhu*, and J. Tafto†
Materials Science Division, Brookhaven National Laboratory, Upton, New York 11973

Received 12 June 2000; published in the issue dated 11 December 2000

See accompanying Physics Focus

We calculate the shadow image in far field below a thin crystal when a coherent electron source is placed at micrometer distances above the specimen, and note that the presence of a planar fault results in very strong oscillatory contrast. We realize these predictions experimentally using a field-emission electron source in a microscope. With this technique, we determine displacement vectors at planar faults with an accuracy down to 1 pm in studies of the Bi2Sr2CaCu2O8 superconductor containing thin intercalated layers.

© 2000 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevLett.85.5126
DOI:
10.1103/PhysRevLett.85.5126
PACS:
61.72.Nn, 61.16.Bg, 74.72.Hs

*Corresponding author. Email address: zhu@bnl.gov

†Visiting scientist from University of Oslo, Norway.

 
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